Home About us Contact | |||
Porous Silicon Layer (porous + silicon_layer)
Selected AbstractsIntegrated inductors on porous siliconPHYSICA STATUS SOLIDI (A) APPLICATIONS AND MATERIALS SCIENCE, Issue 5 2007H. Contopanagos The cover picture illustrates the effective use of a thick porous silicon layer as an integrated micro-plate for RF isolation on a silicon substrate, proposed by Harry Contopanagos and Androula Nassiopoulou in their Original Paper [1] in the current issue. What is plotted is the magnitude of the current distribution (colour coded from blue (low) to high (red) values) on the metallization and on a screen 50 µm underneath the bottom oxide layer of a 2-metal integrated CMOS-compatible inductor on bulk silicon (lower right) and on a 50 µm thick porous silicon layer (upper left) for a frequency of 2.5 GHz. Inductors were designed in a standard 0.13 µm CMOS technology. Efficient RF isolation is produced by the porous Si layer, as evidenced by the virtual elimination of surface currents relative to the case of standard CMOS, indicating virtually complete substrate shielding by a 50 µm thick porous Si layer for the relevant size scale. The quality factor of the inductor with the use of the porous Si layer is increased by 100%, reaching a maximum value of 33 for the design shown. The first author of the article is a visiting senior researcher at the Institute of Microelectronics (IMEL), National Center for Scientific Research "Demokritos" (Athens, Greece). His research focuses on electromagnetics and microwave engineering, artificial materials and photonic crystals, wireless front ends, antennas and high-frequency analog integrated circuits. [source] Possible model of protein nucleation and crystallization on porous siliconPHYSICA STATUS SOLIDI (A) APPLICATIONS AND MATERIALS SCIENCE, Issue 8 2005S. Stolyarova Abstract The problem of macromolecular nucleation and crystallization on porous silicon surface is investigated theoretically. The fractality of the porous silicon layer is exploited. It is shown that the effective surface density of adsorbed particles on a fractal self-similar surface significantly exceeds that on a flat surface. The resulting local supersaturation explains enhanced nucleation phenomena associated with porous silicon. In addition, the self-affine fractal surface exhibits quasi-periodicity that can facilitate long-range ordering of the nucleated molecules, i.e. the crystallization process. Moreover, small elastic constants of porous silicon are favorable for the surface periodicity tuning to different lattice parameters of growing crystals. The anomalous large scaling range (from silicon interatomic distance up to 100 nm) is favorable for the crystallization of wide range of big macromolecules such as proteins. (© 2005 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim) [source] New type of dual macro and nano fractal structure of reaction induced vapor phase stain etched porous siliconPHYSICA STATUS SOLIDI (C) - CURRENT TOPICS IN SOLID STATE PHYSICS, Issue 6 2007S. Stolyarova Abstract A comprehensive study of morphology of Reaction-Induced Vapor Phase Stain Etched porous silicon was performed in order to inspect samples for fractal structure and to estimate their potential for sensing applications. A new dual fractal structure is found in porous silicon layer obtained by Reaction-Induced Vapor Phase Stain Etch. The layer consists of two superposed fractal macro- and nanostructures. The macrostructure is formed due to the condensation of drops while the nanostructure is caused by the chemical reactions of the vapor molecules with the silicon surface. A comparison with morphology of porous silicon prepared by Liquid Phase Stain Etch is also presented. (© 2007 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim) [source] Room temperature gas sensor based on porous silicon/metal oxide structurePHYSICA STATUS SOLIDI (C) - CURRENT TOPICS IN SOLID STATE PHYSICS, Issue 6 2007V. M. Arakelyan Abstract N-type TiO2,x and In2O3 · SnO2 thin films were deposited onto p-type porous silicon layer which was formed by common electrochemical anodization. The current-voltage characteristics of obtained structures and sensitivity to different concentrations of hydrogen in air were studied. Measurements were carried out at room temperature. As shown results of measurements, an exponential growth of the current in forward branch of the current-voltage characteristics of the device made of TiO2,xlayer was detected. Higher sensitivity to hydrogen of the TiO2,x -porous silicon sensor in comparison to structure made of In2O3 · SnO2 film was detected at room temperature (without preheating of work body of the sensor). (© 2007 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim) [source] Small molecule detection by reflective interferometric Fourier transform spectroscopy (RIFTS)PHYSICA STATUS SOLIDI (A) APPLICATIONS AND MATERIALS SCIENCE, Issue 6 2009Claudia Pacholski Abstract A new method for the compensation of matrix effects in biosensing experiments referred to as reflective interferometric Fourier transform spectroscopy (RIFTS) has been developed recently [1]. It employs a porous silicon sensor comprised of two porous silicon layers stacked one on top of the other. The structure has a complicated reflectivity spectrum that can be resolved by FFT analysis leading to three distinctive peaks which are assigned to the layers in the porous silicon structur. If the double layer is appropriately designed, the bottom layer can act as a reference channel. In this paper the specific sensing of small molecules using RIFTS is demonstrated for the first time. Ac-L-Lys-D-Ala-D-Ala has been immobilized to the sensor surface representing the capture probe and vancomycin was used as target analyte. (© 2009 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim) [source] Light propagation and scattering in porous silicon nanocomposite waveguidesPHYSICA STATUS SOLIDI (A) APPLICATIONS AND MATERIALS SCIENCE, Issue 8 2005P. Pirasteh Abstract Planar waveguides have been achieved from oxidised porous silicon layers (OPS) which have been impregnated by solvents, Congo Red (CR) dye and poly(p-phenylene vinylene) (PPV) polymer. Optical loss has been investigated by a simple technique based on surface optical scattering measurements. Optical loss has been studied as a function of the wavelength, impregnation type and CR concentration. The main sources of attenuation, such as absorption, scattering from interface roughness, scattering from nano- crystallites and modification of the refractive indexes after filling are discussed. Optical loss measured at 0.633 µm is about 1.8 dB/cm for the OPS waveguides The optical loss decreases with wavelength. Otherwise, the optical loss increases with the concentration of Congo Red dye which is absorbent at this wavelength. (© 2005 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim) [source] EPR and photoluminescence diagnostics of singlet oxygen generation on porous silicon surfacePHYSICA STATUS SOLIDI (C) - CURRENT TOPICS IN SOLID STATE PHYSICS, Issue 7 2009E. A. Konstantinova Abstract Electron paramagnetic resonance and photoluminescence spectroscopy are used to investigate photosensitized generation of singlet oxygen in the porous silicon layers. The singlet oxygen concentration in the samples was estimated at various oxygen pressures. The time of energy transfer from excitons confined in Si nanocrystals to adsorbed O2 molecules on silicon nanocrystal surface and photosensitization efficiency are found to depend on the porosity of the samples. The singlet oxygen generation efficiency increases strongly for porous silicon with high (>80%) porosity. (© 2009 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim) [source] Large-area epitaxial silicon solar cells based on industrial screen-printing processesPROGRESS IN PHOTOVOLTAICS: RESEARCH & APPLICATIONS, Issue 8 2005Filip Duerinckx Abstract Thin-film epitaxial silicon solar cells are an attractive future alternative for bulk silicon solar cells incorporating many of the process advantages of the latter, but on a potentially cheap substrate. Several challenges have to be tackled before this potential can be successfully exploited on a large scale. This paper describes the points of interest and how IMEC aims to solve them. It presents a new step forward towards our final objective: the development of an industrial cell process based on screen-printing for >,15% efficient epitaxial silicon solar cells on a low-cost substrate. Included in the discussion are the substrates onto which the epitaxial deposition is done and how work is progressing in several research institutes and universities on the topic of a high-throughput epitaxial reactor. The industrial screen-printing process sequence developed at IMEC for these epitaxial silicon solar cells is presented, with emphasis on plasma texturing and improvement of the quality of the epitaxial layer. Efficiencies between 12 and 13% are presented for large-area (98,cm2) epitaxial layers on highly doped UMG-Si, off-spec and reclaim material. Finally, the need for an internal reflection scheme is explained. A realistically achievable internal reflection at the epi/substrate interface of 70% will result in a calculated increase of 3,mA/cm2 in short-circuit current. An interfacial stack of porous silicon layers (Bragg reflectors) is chosen as a promising candidate and the challenges facing its incorporation between the epitaxial layer and the substrate are presented. Experimental work on this topic is reported and concentrates on the extraction of the internal reflection at the epi/substrate interface from reflectance measurements. Initial results show an internal reflectance between 30 and 60% with a four-layer porous silicon stack. Resistance measurements for majority carrier flow through these porous silicon stacks are also included and show that no resistance increase is measurable for stacks up to four layers. Copyright © 2005 John Wiley & Sons, Ltd. [source] |