Multicrystalline Silicon (multicrystalline + silicon)

Distribution by Scientific Domains


Selected Abstracts


Submicron resolution carrier lifetime analysis in silicon with Fano resonances

PHYSICA STATUS SOLIDI - RAPID RESEARCH LETTERS, Issue 7 2010
Paul Gundel
Abstract Defect rich regions in multicrystalline silicon are investigated by Raman spectroscopy at high and low injection levels. By analyzing the Fano type asymmetry and the spectral position of the first order Raman peak crucial properties such as recombination lifetime, doping density and stress can be extracted simultaneously. Due to the small wavelength of the excitation laser the spatial resolution of these measurements is significantly below 1 µm, which gives new insight into the impact of defects on the carrier recombination lifetime. The results are evaluated by comparing them to micro-photoluminescence and synchrotron X-ray fluorescence measurements. (© 2010 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim) [source]


A luminescent solar concentrator with 7.1% power conversion efficiency

PHYSICA STATUS SOLIDI - RAPID RESEARCH LETTERS, Issue 6 2008
L. H. Slooff
Abstract The Luminescent Solar Concentrator (LSC) consists of a transparent polymer plate, containing luminescent particles. Solar cells are connected to one or more edges of the polymer plate. Incident light is absorbed by the luminescent particles and re-emitted. Part of the light emitted by the luminescent particles is guided towards the solar cells by total internal reflection. Since the edge area is smaller than the receiving one, this allows for concentration of sunlight without the need for solar tracking. External Quantum Efficiency (EQE) and current,voltage (I ,V) measurements were performed on LSC devices with multicrystalline silicon (mc-Si) or GaAs cells attached to the sides. The best result was obtained for an LSC with four GaAs cells. The power conversion efficiency of this device, as measured at European Solar Test Installation laboratories, was 7.1% (geometrical concentration of a factor 2.5). With one GaAs cell attached to one edge only, the power efficiency was still as high as 4.6% (geometrical concentration of a factor 10). To our knowledge these efficiencies are among the highest reported for the LSC. (© 2008 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim) [source]


Structure, chemistry and electrical properties of extended defects in crystalline silicon for photovoltaics

PHYSICA STATUS SOLIDI (C) - CURRENT TOPICS IN SOLID STATE PHYSICS, Issue 8 2009
M. Seibt
Abstract The electronic properties of present-day multicrystalline silicon (mc-Si) materials for photovoltaic applications are strongly influenced by point defects, their mutual interaction and their interaction with dislocations and grain boundaries. This paper presents results from fundamental investigations of metal impurity interaction with extended defects, namely a small-angle grain boundary and bulk microdefects. It is shown that the distribution of copper silicide precipitates closely follows the density of bulk microdefects indicating the underlying physics of ,good' and ,bad' grains frequently observed in mc-Si. Co-precipitation of copper and nickel in the same samples leads to virtually the same distribution of multimetal silicide precipitates which according to light-beam induced current measurements show the same recombination activity as single-metal silicide particles. Transmission electron microscopy is used to show that for copper-rich and nickel-rich conditions two types of silicides co-exist, i.e. Cu3Si precipitates containing a small amount of nickel and NiSi2 precipitates containing some copper. Finally, phosphorus-diffusion gettering (PDG) is discussed as the main gettering process used in presentday silicon photovoltaics. Special emphasis is put on the effect of extended defects and their interaction with metal impurities on PDG kinetics. It is shown that different limiting processes will be simultaneously operative in mc-Si as a result of inhomogeneous bulk defect distributions (© 2009 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim) [source]


High-efficiency solar cells on phosphorus gettered multicrystalline silicon substrates

PROGRESS IN PHOTOVOLTAICS: RESEARCH & APPLICATIONS, Issue 8 2006
O. Schultz
Abstract Measurements of the dislocation density are compared with locally resolved measurements of carrier lifetime for p-type multicrystalline silicon. A correlation between dislocation density and carrier recombination was found: high carrier lifetimes (>100,µs) were only measured in areas with low dislocation density (<105,cm,2), in areas of high dislocation density (>106,cm,2) relatively low lifetimes (<20,µs) were observed. In order to remove mobile impurities from the silicon, a phosphorus diffusion gettering process was applied. An increase of the carrier lifetime by about a factor of three was observed in lowly dislocated regions whereas in highly dislocated areas no gettering efficiency was observed. To test the effectiveness of the gettering in a solar cell manufacturing process, five different multicrystalline silicon materials from four manufacturers were phosphorus gettered. Base resistivity varied between 0·5 and 5,,,cm for the boron- and gallium-doped p-type wafers which were used in this study. The high-efficiency solar cell structure, which has led to the highest conversion efficiencies of multicrystalline silicon solar cells to date, was used to fabricate numerous solar cells with aperture areas of 1 and 4,cm2. Efficiencies in the 20% range were achieved for all materials with an average value of 18%. Best efficiencies for 1,cm2 (20·3%) and 4,cm2 (19·8%) cells were achieved on 0·6 and 1·5,,,cm, respectively. This proves that multicrystalline silicon of very different material specification can yield very high efficiencies if an appropriate cell process is applied. Copyright © 2006 John Wiley & Sons, Ltd. [source]


Chemical natures and distributions of metal impurities in multicrystalline silicon materials

PROGRESS IN PHOTOVOLTAICS: RESEARCH & APPLICATIONS, Issue 6 2006
T. Buonassisi
Abstract We present a comprehensive summary of our observations of metal-rich particles in multicrystalline silicon (mc-Si) solar cell materials from multiple vendors, including directionally-solidified ingot-grown, sheet, and ribbon, as well as multicrystalline float zone materials contaminated during growth. In each material, the elemental nature, chemical states, and distributions of metal-rich particles are assessed by synchrotron-based analytical x-ray microprobe techniques. Certain universal physical principles appear to govern the behavior of metals in nearly all materials: (a) Two types of metal-rich particles can be observed (metal silicide nanoprecipitates and metal-rich inclusions up to tens of microns in size, frequently oxidized), (b) spatial distributions of individual elements strongly depend on their solubility and diffusivity, and (c) strong interactions exist between metals and certain types of structural defects. Differences in the distribution and elemental nature of metal contamination between different mc-Si materials can largely be explained by variations in crystal growth parameters, structural defect types, and contamination sources. Copyright © 2006 John Wiley & Sons, Ltd. [source]