Home About us Contact | |||
Microscopic Origin (microscopic + origin)
Selected AbstractsNanoscale Conducting Channels at the Surface of Organic Semiconductors Formed by Decoration of Molecular Steps with Self-Assembled MoleculesADVANCED FUNCTIONAL MATERIALS, Issue 23 2009Bumsu Lee Abstract Under certain conditions, self-assembling molecules preferentially bind to molecular steps at the surface of crystalline organic semiconductors, inducing a strong local doping effect. This creates macroscopically long conducting paths of nanoscale width (a single crystalline analogue of organic nanowires) that can span distances of up to 1,cm between electrical contacts. The observed effect of molecular step decoration opens intriguing possibilities for visualization, passivation, and selective doping of surface and interfacial defects in organic electronic devices and provides a novel system for research on nanoscale charge transport in organic semiconductors. In addition, this effect sheds light on the microscopic origin of nucleation and growth of self-assembled monolayers at organic surfaces. It can also have implications in electronic patterning, nanoscale chemical sensors, integrated interconnects and charge-transfer interfaces in organic transistors and solar cells. [source] Atomic Structures and Electrical Properties of ZnO Grain BoundariesJOURNAL OF THE AMERICAN CERAMIC SOCIETY, Issue 2 2007Yukio Sato Various properties of ceramics can be significantly influenced by the presence of grain boundaries. The influence on the properties is closely related to the grain-boundary atomic structures. As different grain boundaries have different atomic structure, different grain boundaries have different influence on the properties. It is difficult to examine the atomic structure and properties of individual grain boundaries in ceramics. In order to understand the atomic,structure,property relationships, well-defined single grain boundaries should be characterized. In the present paper, we review our recent results on the investigations of atomic structures and electrical properties of ZnO single grain boundaries. The relationships between the atomic structures and the electrical properties were investigated using ZnO bicrystals, whose grain-boundary orientation relationship and grain-boundary planes can be arbitrarily controlled. The discussion focuses on the microscopic origin of nonlinear current,voltage (I,V) characteristics across ZnO grain boundaries. High-resolution transmission electron microscopy (HRTEM) observations and lattice-statics calculations revealed the atomic structures of the undoped ZnO [0001] ,7 and ,49 grain boundaries, enabling a comparison between coincidence site lattice (CSL) boundaries with small and large periodicity. These grain boundaries contained the common structural units (SUs) featuring atoms with coordination numbers that are unusual in ZnO. The ,49 boundary was found to have characteristic arrangement of the SUs, where two kinds of the SUs are alternatively formed. It is considered that the characteristic arrangement was formed to effectively relax the local strain in the vicinity of the boundary. Such a relaxation of local strain is considered to be one of dominant factors to determine the SU arrangements along grain boundaries. I,V measurements of the undoped ZnO bicrystals showed linear I,V characteristics. Although the coordination and bond lengths of atoms in the grain boundaries differ from those in the bulk crystal, this does apparently not generate deep unoccupied states in the band gap. This indicates that atomic structures of undoped ZnO grain boundaries are not responsible for the nonlinear I,V characteristics of ZnO ceramics. On the other hand, the nonlinear I,V characteristic appeared when doping the boundaries with Pr. High-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) image of Pr-doped boundaries revealed that Pr segregates to specific atomic columns, substituting Zn at the boundary. However, the Pr itself was not the direct origin of the nonlinear I,V characteristics, as the Pr existed in the three-plus state and would not produce acceptor states in the boundary. First-principles calculations revealed that Pr doping instead promotes the formations of acceptor-like native defects, such as Zn vacancies. We believe that such acceptor-like native defects are microscopic origin of the nonlinear I,V characteristics. Investigations of various types of grain boundaries in the Pr and Co-codoped ZnO bicrystals indicated that the amounts of Pr segregation and the nonlinear I,V characteristics significantly depend on the grain-boundary orientation relationship. Larger amount of Pr segregation and, as a result, higher nonlinearity in I,V characteristics was obtained for incoherent boundaries. This indicates that Pr doping to incoherent boundaries is one of the guidelines to design the single grain boundaries with highly nonlinear I,V characteristics. Finally, a Pr and Co-codoped bicrystal with an incoherent boundary was fabricated to demonstrate a highly nonlinear I,V characteristic. This result indicates that ZnO single-grain-boundary varistors can be designed by controlling grain-boundary atomic structures and fabrication processes. Summarizing, our work firstly enabled us to gain a deeper understanding for the atomic structure of ZnO grain boundaries. Secondly, we obtained important insight into the origin of nonlinear I,V characteristics across the ZnO grain boundaries. And, finally, based on these results, we demonstrated the potential of this knowledge for designing and fabricating ZnO single-grain-boundary varistors. [source] Electron paramagnetic resonance study of phosphorus-doped n-type homoepitaxial diamond films grown by chemical vapor depositionPHYSICA STATUS SOLIDI (A) APPLICATIONS AND MATERIALS SCIENCE, Issue 13 2006M. Katagiri Abstract Electron paramagnetic resonance technique has been applied to identify the microscopic origin of the n-type conductivity in phosphorus-doped {111}-homoepitaxial diamond films grown by chemical vapor deposition. The NIMS-1 center having the D2d symmetry with g|| = 1.9983, g^ = 2.0072 and the 31P hyperfine interaction of A|| = 5.77 mT, A, = 1.21 mT at 30 K is identified to be arising from the phosphorus donors based on the number of spins which matches to the number of the electrically active phosphorus atoms in the films. The wave function of the unpaired electron is localized by 12% on the phosphorus atom with a predominant p-character. (© 2006 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim) [source] Effect of cooling field strength and ferromagnetic shell shape on exchange bias in nanoparticles with inverted ferromagnetic,antiferromagnetic core-shell morphologyPHYSICA STATUS SOLIDI (B) BASIC SOLID STATE PHYSICS, Issue 4 2010Yong Hu Abstract The dependence of exchange bias (EB) effects on cooling field strength and particle shape in nanoparticles with antiferromagnetic (AFM) interfacial coupling and inverted AFM core with a fixed radius and ferromagnetic (FM) shell with various thicknesses are investigated by using a modified Monte Carlo Metropolis method. It is found that with the increase of cooling field, field-cooled exchange bias field (HE) fluctuates in the range of negative values initially, and then has an abrupt jump from the negative value to the positive value, finally levels off. However, HE decreases as the FM shell shape varies from No. 1 to No. 13 regardless of the strength of cooling field. Coercivity is affected by cooling fields and shapes indicating distinct behaviors. Because the AFM core is almost unaffected by shape and frozen completely during measuring hysteresis loops, the effect of ferromagnets on EB, negligible in most of other systems, is ambiguously manifested in such an unconventionally structural system. Moreover, the phenomena are interpreted well by presenting the snapshots of microscopic spin energy distributions, which make us observe directly and vividly the movement of domains and the competition of energies. This work will shed new light into the microscopic origin of peculiar magnetic properties of nanoparticles with special structures. [source] Apical oxygen, 3D-2D cross over and superconductivity in Sm2,xCexCuO4,,PHYSICA STATUS SOLIDI (C) - CURRENT TOPICS IN SOLID STATE PHYSICS, Issue 9 2006M. Boujida Abstract In spite of the vast amount of experimental and theoretical articles accumulated in HTSC, the mechanism of the interaction driving charge carriers to form Cooper pairs below Tc is still unknown. The comparison of the normal state transport properties of YBa2Cu3O7,, and the Sm2,xCexCuO4,, [1, 2] might shed some light on the microscopic origin of HTSC. In comparison to the YBCO, the apical oxygen in Sm2,xCexCuO4,, [3] destroys the superconductivity via the vertical ionic bonding which localizes the charge in the Cu-O squares, however the hole transfer by moving O(4) towards the CuO2 planes, leads to the optimization of YBCO properties. The behaviour of C axis parameter vs the oxygen content cannot be explained by a BSC mechanism. The high amount of anisotropy ratio [4] is explained by the sheer square planes in NCCO system, i.e. without apical oxygen (SC with Tc maximum). From the data of the resistivity in the normal state, we conclude the observation of a 3D-2D cross over only in Sm2,xCexCuO4,, [2] and Nd2,xCexCuO4,, [5] which is also related to its high anisotropy. The competition between anisotropy and superconductivity destroys the superconducting state in the 2D limit even in the ground state. In this material the superconductivity cannot be enhanced at high temperature because the compound is a quasi 2D system (sheer square planes of CuO2) and the cuprate superconductors is a genuine three-dimensional (3D) phenomenon [6]. The Josephson coupling between the different layers is S-I-S for NCCO and S-N-S for YBCO, thus the Lawrence and Doniach model (LD) [7] with neighbouring layers coupled by the Josephson tunnelling is appropriate. In summary the behaviour of apical oxygen is intrinsically different in the two kinds of cuprates. (© 2006 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim) [source] Optical micro-characterization of group-III-nitrides: correlation of structural, electronic and optical propertiesPHYSICA STATUS SOLIDI (C) - CURRENT TOPICS IN SOLID STATE PHYSICS, Issue 6 2003J. Christen Abstract For a detailed understanding of complex semiconductor heterostructures and the physics of devices based on them, a systematic determination and correlation of the structural, chemical, electronic, and optical properties on a micro- or nano-scale is essential. Luminescence techniques belong to the most sensitive, non-destructive methods of semiconductor research. The combination of luminescence spectroscopy with the high spatial resolution of a scanning electron microscope, as realized by the technique of cathodoluminescence microscopy, provides a powerful tool for the optical nano-characterization of semiconductors, their heterostructures as well as their interfaces. Additional access to the local electronic and structural properties is provided by micro-Raman spectroscopy, e.g. giving insight into the local free carrier concentration and local stress. In this paper, the properties of group-III-nitrides are investigated by highly spatially and spectrally resolved cathodoluminescence microscopy in conjunction with micro-Raman spectroscopy. Complex phenomena of self-organization and their strong impact on the microscopic and nanoscopic properties of both binary and ternary nitrides are presented. As the ultimate measure of device performance, the microscopic properties of light emitting diodes are assessed under operation. Using micro-electroluminescence mapping in the optical microscope as well as in the near field detection mode of a scanning near field optical microscope, the microscopic origin of the macroscopic spectral red shift in light emitting diodes is identified. (© 2003 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim) [source] |