International Comparison Tests (international + comparison_test)

Distribution by Scientific Domains


Selected Abstracts


International comparison test in Asia-Pacific region for impulse voltage measurements

ELECTRICAL ENGINEERING IN JAPAN, Issue 3 2009
Takayuki Wakimoto
Abstract The national standard class divider for the lightning impulse voltage measurements in Japan was developed in 1998. After three years, the standard impulse voltage calibrator has also been manufactured. These standard equipment are used as an industrial standard, and the performance had been evaluated annually supported by the Ministry of Economy, Trade and Industry (METI). The standard impulse measuring system including the standard divider participated in the worldwide comparison test and its good performance was confirmed in 1999. Another international comparison test was carried out among three countries in the Asia-Pacific region in 2004 again and the standard measuring system participated in the test. In this paper, the details and the results of the international comparison tests in 2004 are described. © 2008 Wiley Periodicals, Inc. Electr Eng Jpn, 166(3): 46, 54, 2009; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/eej.20677 [source]


Recent developments on high current measurement using current shunt

IEEJ TRANSACTIONS ON ELECTRICAL AND ELECTRONIC ENGINEERING, Issue 5 2007
Tatsuo Kawamura Honorary Member
Abstract The Short-circuit Testing Liaison (STL) is the organization that consists of high power testing laboratories of the world. Member laboratories perform short-circuit tests under uniform interpretations of the IEC standards agreed through technical discussions and information exchanges among them. One of the recent projects that the STL has been working on is to establish uncertainty and traceability of high current measurement by international comparison tests with reference shunts. In concert with this project, the IEC Working Group is preparing the new standard for high current measurements. Copyright © 2007 Institute of Electrical Engineers of Japan. Published by John Wiley & Sons, Inc. [source]