Home About us Contact
|
Home About us Contact | ||
|
|
||
Diffraction Peaks (diffraction + peak)
Selected AbstractsApplication of molecular replacement to protein powder data from image platesACTA CRYSTALLOGRAPHICA SECTION D, Issue 4 2009Jennifer A. Doebbler Macromolecular structures can be solved via molecular replacement from powder diffraction data collected not only on multi-analyzer diffractometers but also on image plates. Diffraction peaks recorded on image plates are generally broader than those collected using an array of crystal analyzer detectors, but the image-plate data often allow the use of powder data to lower d -spacings. Owing to the high incidence of overlaps in powder patterns, which is especially evident for larger structures, a multi-pattern Pawley refinement is necessary in order to distinguish intensity peaks. This work utilized various salt concentrations to produce small lattice distortions, which resulted in shifts of Bragg peak positions, in a suite of five powder patterns. Using reflection structure factors obtained from this combined refinement, the structure of hen egg-white lysozyme was determined by molecular replacement using the 60% identical human lysozyme (PDB code 1lz1) as the search model. This work also expands upon previous work by presenting a full-scale multi-species analysis combined with an investigation of the sensitivity with regard to discrimination between incorrect fold types. To test the limits of this technique, extension to higher molecular-weight structures is ongoing. [source] Polymer Viscoelasticity and Residual Stress Effects on Nanoimprint Lithography,ADVANCED MATERIALS, Issue 10 2007Y. Ding The decay kinetics of polystyrene (PS) gratings are monitored by tracking the intensity of the first-order laser diffraction peak as a function of annealing time. For low-molecular-mass PS (24,kg,mol,1, blue circles), an exponential response suggests that the pattern decay is a surface-tension- driven viscous flow. In high-molecular-mass PS (1007,kg,mol,1, green circles) a complicated response includes a rapid elastic recovery, a power-law creep, and a viscouslike flow (see figure). [source] Diffraction analysis of perovskite-like oxides containing irregular intergrowthsJOURNAL OF APPLIED CRYSTALLOGRAPHY, Issue 1 2009L. Olikhovska Features of the X-ray intensity distributions caused by the presence of random and nonrandom stacking faults (irregular intergrowths) in layered perovskite-like oxides are studied by a computer simulation technique. It is shown that, apart from the stacking fault properties, the position, profile and intensity of a diffraction peak are dependent on the ratio between the c lattice parameter of the crystal and the thickness of the new structural fragment formed as a result of the stacking fault. A means of characterizing the stacking faults on the basis of the relative positions of pairs of diffraction peaks is presented. The approach is exemplified by the X-ray diffraction study of a disordered single crystal of the system Bi,Sr,Ca,Cu,O. [source] MarqX: a new program for whole-powder-pattern fittingJOURNAL OF APPLIED CRYSTALLOGRAPHY, Issue 1 2000Y. H. Dong MarqX is a computer program for the modelling of powder diffraction data. It can be used for an unconstrained profile fitting (pattern decomposition, PD) or constrained modelling of the whole powder pattern (Pawley method, PM), for single- as well as multiple-phase samples. The program output includes: lattice parameters or peak positions (for PM and PD, respectively), width and shape of the diffraction peak (in terms of half width at half-maximum and mixing parameter of a pseudo-Voigt function), corrected for the instrumental broadening component, intensity, peak area and profile asymmetry. In addition, errors on the goniometer zero and shift in sample position with respect to the goniometric axis can also be modelled, together with distance and relative intensity of the spectral components of the X-ray beam (e.g.K,1 and K,2). Specific output files are provided for line-profile analysis, including the Williamson,Hall plot and Warren,Averbach method. [source] Morphology and mechanical and viscoelastic properties of rubbery epoxy/organoclay montmorillonite nanocompositesJOURNAL OF APPLIED POLYMER SCIENCE, Issue 6 2007Amar Boukerrou Abstract The morphology and mechanical and viscoelastic properties of rubbery epoxy/organoclay montmorillonite (MMT) nanocomposites were investigated with wide-angle X-ray scattering (WAXS), transmission electron microscopy (TEM), tensile testing, and dynamic mechanical thermal analysis. An ultrasonicator was used to apply external shearing forces to disperse the silicate clay layers in the epoxy matrix. The first step of the nanocomposite preparation consisted of swelling MMT in a curing agent, that is, an aliphatic diamine based on a polyoxypropylene backbone with a low viscosity for better diffusion into the intragalleries. Then, the epoxy prepolymer was added to the mixture. Better dispersion and intercalation of the nanoclay in the matrix were expected. The organic modification of MMT with octadecylammonium ions led to an increase in the initial d -spacing (the [d001] peak) from 14.4 to 28.5 Å, as determined by WAXS; this indicated the occurrence of an intercalation. The addition of 5 phr MMTC18 (MMT after the modification) to the epoxy matrix resulted in a finer dispersion, as evidenced by the disappearance of the diffraction peak in the WAXS pattern and TEM images. The mechanical and viscoelastic properties were improved for both MMT and MMTC18 nanocomposites, but they were more pronounced for the modified ones. © 2006 Wiley Periodicals, Inc. J Appl Polym Sci 103: 103: 3547,3552, 2007 [source] Core-Shell Nanoblends from Soy Protein/Polystyrene by Emulsion PolymerizationMACROMOLECULAR MATERIALS & ENGINEERING, Issue 8 2008Dagang Liu Abstract Novel soy protein/polystyrene nanoblends with core-shell structures were successfully prepared by introducing nano-sized PS into soy protein through emulsion polymerization. The nanoblends showed core-shell structures, with the core being of PS and the shell of sodium dodecane sulfonate and soy protein polypeptides, when investigated by electron microscopy. Nanoblends containing high levels of PS (>30%) exhibited characteristic infrared spectrum bands, X-ray diffraction peak, and glass transition, since PS microsphere aggregated to form independent PS domains. Mechanical strength and water resistance were effectively improved by introducing PS. An effective structure-performance relationship was thereby established to describe the nanoblends. [source] Fabrication of a n -type ZnO/p -type Cu,Al,O heterojunction diode by sputtering deposition methodsPHYSICA STATUS SOLIDI (C) - CURRENT TOPICS IN SOLID STATE PHYSICS, Issue 5 2009Satoru Takahata Abstract CuAlO2 polycrystalline films were deposited by the helicon-wave-excited plasma sputtering (HWPS) method at 700 °C. The best full-width at half-maximum value of the (006) CuAlO2 X-ray diffraction peak was 0.19 degrees, which was similar to those reported previously using other deposition methods. While, noncrystalline Cu,Al,O films were deposited by a conventional RF sputtering method. Using this p -type transparent conducting oxide (TCO) film and an n -type ZnO film deposited by HWPS, a n -type ZnO/p -type Cu,Al,O heterojunction diode was fabricated. Optical transmittance of the device was approximately 80% in the near infrared region. The rectifying current,voltage characteristics with a threshold forward voltage approximately 1.4 V were obtained. These results are the first step toward realizing an electrical/optical device using p -type CuAlO2 or Cu-Al-O films. (© 2009 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim) [source] Ga-doped ZnO transparent conducting films prepared by helicon-wave-excited plasma sputteringPHYSICA STATUS SOLIDI (C) - CURRENT TOPICS IN SOLID STATE PHYSICS, Issue 5 2009Shingo Masaki Abstract Gallium-doped zinc oxide (ZnO:Ga) transparent conducting films were prepared by the helicon-wave-excited plasma sputtering (HWPS) method. The films exhibited a dominant [0001]-oriented growth with a small full width at half maximum of the (0002) ZnO diffraction peak (0.28 degrees). A high optical transmittance greater than 80% was achieved in the wavelength range between 400 and 1600 nm, because the HWPS method essentially does not damage the film surface. The results indicate that CdS-free Cu(In,Ga)Se2 -based solar cells may be fabricated by sputtering ZnO:Ga directly on the Cu(In,Ga)Se2 layer using the HWPS method. (© 2009 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim) [source] Buffer breakdown voltage of AlGaN/GaN HFET on a 4 inch Si(111) substrate grown by MOCVDPHYSICA STATUS SOLIDI (C) - CURRENT TOPICS IN SOLID STATE PHYSICS, Issue 7 2007Masayuki Iwami Abstract The buffer breakdown voltage and the electron mobility in a two dimensional gas (2DEG) of AlGaN/GaN HFETs on 4 inch Si(111) substrates grown by metalorganic chemical vapor deposition was investigated. The relationship between the electrical properties of HFETs and the crystalline quality of the GaN layer are studied by X-ray diffraction and photoluminescence measurements. The buffer breakdown voltage decreases with an increase in the FWHM of the X-ray (0002) diffraction peak. The electron mobility in a 2DEG decreases with an increase in FWHM of the X-ray (102) diffraction peak. These results indicate that a screw component of the threading dislocations in the GaN layer is a primary source for buffer leakage, and that edge dislocations in the GaN layer have a scattering effect on the 2DEG transport. (© 2007 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim) [source] Role of structural modification on the electrical properties of poly(ethylene terephthalate) irradiated with 90-MeV carbon ion beamPOLYMER ENGINEERING & SCIENCE, Issue 6 2008A. Srivastava Thin films of poly(ethylene terephthalate) (PET) having a thickness of 100 ,m were exposed to different ion fluence of swift heavy ions of carbon in the range of 5 × 1011 , 5 × 1013 ions/cm2. The effect of ion beam on structural and electrical modification has been studied by UV/vis, FTIR, X-ray diffraction (XRD), Differential Scanning Calorimetery (DSC), and AC electrical measurement techniques. On irradiation, a shift in absorption wavelength toward the red end of spectrum with increase of ion fluence was observed. The intensity of crystalline IR bands and main diffraction peak in XRD pattern were found to decrease with increase in ion fluence. It indicates the loss of crystallinity induced by ion-beam irradiation. The crystallite size was found to increase on irradiation. The melting temperature (Tm) of PET films increased at a low ion dose (5.0 × 1012 ions/cm2), while it decreased at higher ion fluence (50.0 × 1012 ions/cm2). The dielectric constant (,,) of PET films was increased with increase of ion fluence. The modifications brought about in the dielectric constant are correlated with chemical and molecular structural changes occurring on irradiation. POLYM. ENG. SCI., 2008. © 2008 Society of Plastics Engineers. [source] Influence of the substrate temperature on the structural, optical, and electrical properties of tin selenide thin films deposited by thermal evaporation methodCRYSTAL RESEARCH AND TECHNOLOGY, Issue 1 2010N. Kumar Abstract Thin films of tin selenide (SnSe) were deposited on sodalime glass substrates, which were held at different temperatures in the range of 350-550 K, from the pulverized compound material using thermal evaporation method. The effect of substrate temperature (Ts) on the structural, morphological, optical, and electrical properties of the films were investigated using x-ray diffraction analysis (XRD), scanning electron microscopy (SEM), transmission measurements, and Hall-effect characterization techniques. The temperature dependence of the resistance of the films was also studied in the temperature range of 80-330 K. The XRD spectra and the SEM image analyses suggest that the polycrystalline thin films having uniform distribution of grains along the (111) diffraction plane was obtained at all Ts. With the increase of Ts the intensity of the diffraction peaks increased and well-resolved peaks at 550 K, substrate temperature, were obtained. The analysis of the data of the optical transmission spectra suggests that the films had energy band gap in the range of 1.38-1.18 eV. Hall-effect measurements revealed the resistivity of films in the range 112-20 , cm for films deposited at different Ts. The activation energy for films deposited at different Ts was in the range of 0.14 eV-0.28 eV as derived from the analysis of the data of low-temperature resistivity measurements. (© 2010 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim) [source] Synthesis, Structure and Electrical Properties of Mo-doped CeO2,Materials for SOFCsFUEL CELLS, Issue 5 2009Q. Li Abstract In this paper, we report the synthesis, structure and electrical conductivity of Mo-doped compounds with a nominal chemical formula of Ce1,xMoxO2+, (x,=,0.05, 0.07, 0.1) (CMO). The formation of fluorite-like structure with a small amount of Ce8Mo12O49 impurity (JCPDS Card No. 31-0330) was confirmed using a powder X-ray diffraction (PXRD). The fluoride-type structure was retained under wet H2 and CH4 atmospheres at 700 and 800,°C, while diffraction peaks due to metal Mo were observed in dry H2 under the same condition. AC impedance measurements showed that the total conductivity increases with increasing Mo content in CMO, and among the investigated samples, Ce0.9Mo0.1O2+, exhibited the highest electrical conductivity with a value of 2.8,×,10,4 and 5.08,×,10,2 S cm,1 at 550,°C in air and wet H2, respectively. The electrical conductivity was found to be nearly the same, especially at high temperatures, in air, O2 and N2. Chemical compatibility of Ce0.9Mo0.1O2+, with 10,mol-% Y2O3 stabilised ZrO2 (YSZ) and Ce0.9Gd0.1O1.95 (CGO) oxide ion electrolytes in wet H2 was evaluated at 800,1,000,°C, using PXRD and EDX analyses. PXRD showed that CMO was found to react with YSZ electrolyte at 1,000,°C. The area specific polarisation resistance (ASPR) of Ce0.9Mo0.1O2+, on YSZ was found to be 8.58,ohm,cm2 at 800,°C in wet H2. [source] The Microstructure of Biogenic Calcite: A View by High-Resolution Synchrotron Powder Diffraction,ADVANCED MATERIALS, Issue 18 2006B. Pokroy Biogenic calcite obtained from different mollusk shells is subjected to heat treatments at elevated temperatures and structurally analyzed by high-resolution synchrotron X-ray powder diffraction. Remarkable broadening of diffraction peaks in samples annealed at temperatures above 200,°C is observed (see figure), indicating heat-induced degradation of intra-crystalline proteins occluded in the mineral lattice during biomineralization. [source] Microbeam X-ray diffraction from twisted lamellar crystals: theory and computer simulationJOURNAL OF APPLIED CRYSTALLOGRAPHY, Issue 4 2009Valeriy A. Luchnikov The diffraction peak position, width and intensity distribution are calculated for the case of a helicoidally twisted crystalline lamella, both analytically and numerically. It is shown that the diffraction peak broadening depends on the orientation of the corresponding reciprocal-space vector with respect to the helicoid axis and the normal to the lamellar basal plane. The equatorial peaks, which are close to the normal direction to the lamellar basal plane, are characterized by the highest azimuthal width. By contrast, the reflections positioned close to the lamellar surface have the smallest azimuthal width. For non-equatorial peaks in the proximity of the twisting axis the intensity has an unusual asymmetric shape. The shape of the microbeam, as well as its position and direction with respect to the lamella, influences the shape of the diffraction peaks in reciprocal space and their appearance in two-dimensional diffractograms. The proposed approach can be useful, for example, for the interpretation of microbeam diffractograms of banded polymer spherulites. [source] Diffraction analysis of perovskite-like oxides containing irregular intergrowthsJOURNAL OF APPLIED CRYSTALLOGRAPHY, Issue 1 2009L. Olikhovska Features of the X-ray intensity distributions caused by the presence of random and nonrandom stacking faults (irregular intergrowths) in layered perovskite-like oxides are studied by a computer simulation technique. It is shown that, apart from the stacking fault properties, the position, profile and intensity of a diffraction peak are dependent on the ratio between the c lattice parameter of the crystal and the thickness of the new structural fragment formed as a result of the stacking fault. A means of characterizing the stacking faults on the basis of the relative positions of pairs of diffraction peaks is presented. The approach is exemplified by the X-ray diffraction study of a disordered single crystal of the system Bi,Sr,Ca,Cu,O. [source] Stress and elastic-constant analysis by X-ray diffraction in thin filmsJOURNAL OF APPLIED CRYSTALLOGRAPHY, Issue 3-2 2003F. Badawi Residual stresses influence most physical properties of thin films and are closely related to their microstructure. Among the most widely used methods, X-ray diffraction is the only one allowing the determination of both the mechanical and microstructural state of each diffracting phase. Diffracting planes are used as a strain gauge to measure elastic strains in one or several directions of the diffraction vector. Important information on the thin-film microstructure may also be extracted from the width of the diffraction peaks: in particular, the deconvolution of these peaks allows values of coherently diffracting domain size and microdistortions to be obtained. The genesis of residual stresses in thin films results from multiple mechanisms. Stresses may be divided into three major types: epitaxic stresses, thermal stresses and intrinsic stresses. Diffraction methods require the knowledge of the thin-film elastic constants, which may differ from the bulk-material values as a result of the particular microstructure. Combining an X-ray diffractometer with a tensile tester, it is possible to determine X-ray elastic constants of each diffracting phase in a thin-film/substrate system, in particular the Poisson ratio and the Young modulus. It is important to notice that numerous difficulties relative to the application of diffraction methods may arise in the case of thin films. [source] Contribution to X-ray analysis of carbo-nitrided steel layersJOURNAL OF APPLIED CRYSTALLOGRAPHY, Issue 5 2001J. M. Sprauel The non-destructive X-ray diffraction method is used to analyse carbo-nitrided steel layers after wear testing. These measurements are carried out on the two major phases of the material, i.e. the martensite and the retained austenite. Such measurements are particularly difficult for three reasons. First, strong gradients exist across the wear track. Second, the diffraction peaks obtained for the martensite are broadened, as a result of the overlap of different reflections of the tetragonal structure. Third, the studied material is multiphase. Its major phases are martensite and austenite, but it also contains carbide and nitride clusters, which lead to incoherent scattering of X-rays. A new quantitative phase analysis method is thus proposed to define the volume fractions of these different constituents of the material. This method accounts for the evolution of the background level during wear. A micro-mechanical model is then developed to process the diffraction peak positions obtained for the martensite and the retained austenite. This model defines the `true' stress and carbon content of both phases. It also allows separation of the reflections of the martensite. The true widths of the diffraction peaks, which characterize the plastic deformation, can thus be quantified. Results for wear-test specimens show a strong plastic deformation of the retained austenite during contact fatigue. This leads to a partial transformation of this phase into martensite. In the martensite, on the contrary, the plastic deformation remains low but the carbon content decreases. This is caused by a stress-induced precipitation of carbides. [source] X-ray diffraction analysis of stacking and twin faults in f.c.c. metals: a revision and allowance for texture and non-uniform fault probabilitiesJOURNAL OF APPLIED CRYSTALLOGRAPHY, Issue 2 2000L. Velterop A revision is presented of the original description by Warren [X-ray Diffraction, (1969), pp. 275,298. Massachusetts: Addison-Wesley] of the intensity distribution of powder-pattern reflections from f.c.c. metal samples containing stacking and twin faults. The assumptions (in many cases unrealistic) that fault probabilities need to be very small and equal for all fault planes and that the crystallites in the sample have to be randomly oriented have been removed. To elucidate the theory, a number of examples are given, showing how stacking and twin faults change the shape and position of diffraction peaks. It is seen that significant errors may arise from Warren's assumptions, especially in the peak maximum shift. Furthermore, it is explained how to describe powder-pattern reflections from textured specimens and specimens with non-uniform fault probabilities. Finally, it is discussed how stacking- and twin-fault probabilities (and crystallite sizes) can be determined from diffraction line-profile measurements. [source] Crystallization, orientation morphology, and mechanical properties of biaxially oriented starch/polyvinyl alcohol filmsJOURNAL OF APPLIED POLYMER SCIENCE, Issue 1 2008Jing Wang Abstract Biaxially oriented starch/polyvinyl alcohol (PVA) films were prepared by stretching starch/PVA blend precursor films that were fabricated by extrusion casting via a twin-screw extruder. Investigations on crystallization, orientation morphology, and mechanical properties of extrusion cast and stretched starch/PVA films were carried out by using differential scanning calorimetry, scanning electron microscope, wide angle X-ray diffraction (WAXD), and tensile testing. The fresh extrusion-cast starch/PVA films, which were almost amorphous, can crystallize spontaneously when aged at room condition. A good compatibility between starch and PVA was obtained by extrusion-casting technology. The well-developed molecular orientation, which did not occur along the machine direction during the extruding process, was observed in stretched film samples. Stretching unaged films can induce crystallization and the orientation of crystalline structures during stretching, resulting in the changes in diffraction peaks of WAXD patterns. The effect of stretch ratio and the orientation distribution in the plane of the film on mechanical properties of stretched films was studied, and the equal biaxially oriented films were found to exhibit in-plane isotropy. © 2008 Wiley Periodicals, Inc. J Appl Polym Sci, 2008 [source] Novel interpenetrating networks with shape-memory propertiesJOURNAL OF POLYMER SCIENCE (IN TWO SECTIONS), Issue 5 2007Shifeng Zhang Abstract Novel polyesterurethane/poly(ethylene glycol) dimethacrylate (PEGDMA) interpenetrating networks (IPNs) with good shape-memory properties were synthesized using solvent casting method. The star-shaped oligo[(rac -lactide)- co -glycolide] was coupled with isophorone diisocyanate to form a polyesterurethane network (PULG), and PEGDMA was photopolymerized to form another polyetheracrylate network. IPNs were transparent and gel content exceeded 92%. The values of strain fixity rate and strain recovery rate were above 93%. PULG and PEGDMA networks in IPNs were amorphous and did not show any characteristic diffraction peaks in X-ray diffraction spectra. Only one glass transition temperature (Tg) of the IPNs between Tg of PEGDMA and PULG was observed, which was proportional to PEGDMA content. PULG and PEGDMA networks were miscible when PEGDMA content was below 50 wt %. The hydrophilicity, transition temperatures, and mechanical properties of IPNs could be conveniently adjusted through variation of network compositions to match the promising potential clinical or medical applications. © 2007 Wiley Periodicals, Inc. J Polym Sci Part A: Polym Chem 45: 768,775, 2007 [source] Texture analysis from synchrotron diffraction images with the Rietveld method: dinosaur tendon and salmon scaleJOURNAL OF SYNCHROTRON RADIATION, Issue 3 2005Mark Goodwin A Rietveld method is described which extracts information on crystal structure, texture and microstructure directly from two-dimensional synchrotron diffraction images. This is advantageous over conventional texture analysis that relies on individual diffraction peaks, particularly for low-symmetry materials with many overlapping peaks and images with a poor peak-to-background ratio. The method is applied to two mineralized biological samples with hydroxylapatite fabrics: an ossified pachycephalosaurid dinosaur tendon and an Atlantic salmon scale. Both are measured using monochromatic synchrotron X-rays. The dinosaur tendon has very strongly oriented crystals with c -axes parallel to the tendon direction. The salmon scale displays a weak texture. [source] Structural properties and mechanical behavior of injection molded composites of polypropylene and sisal fiberPOLYMER COMPOSITES, Issue 3 2002X. L. Xie Composites based on isotactic polypropylene (PP) and sisal fiber (SF) were prepared by melt mixing and injection molding. The melt mixing characteristics, thermal properties, morphology, crystalline structure, and mechanical behavior of the PP/SF composites were systematically investigated. The results show that the PP/SF composites can be melt mixed and injection molded under similar conditions as the PP homo-polymer. For the composites with low sisal fiber content, the fibers act as sites for the nucleation of PP spherulites, and accelerate the crystallization rate and enhance the degree of crystallinity of PP. On the other hand, when the sisal fiber content is high, the fibers hinder the molecular chain motion of PP, and retard the crystallization. The inclusion of sisal fiber induces the formation of ,-form PP crystals in the PP/SF composites and produces little change in the inter-planar spacing corresponding to the various diffraction peaks of PP. The apparent crystal size as indicated by the several diffraction peaks such as L(110),, L(040),, L(130), and L(300), of the , and ,-form crystals tend to increase in the PP/SF composites considerably. These results lead to the increase in the melting temperature of PP. Moreover, the stiffness of the PP/SF composites is improved by the addition of sisal fibers, but their tensile strength decreases because of the poor interfacial bonding. The PP/SF composites are toughened by the sisal fibers due to the formation of ,-form PP crystals and the pull-out of sisal fibers from the PP matrix, both factors retard crack growth. [source] Electrical transport properties of aliovalent cation-doped CeO2ASIA-PACIFIC JOURNAL OF CHEMICAL ENGINEERING, Issue 1 2009Mark C. Pearce Abstract We report the comparative electrical properties of monovalent (Na+), divalent (Ca2+, Sr2+), trivalent (In3+, La3+) and coupled substitution of divalent and trivalent (Ca2+ + Sm3+) cation-doped CeO2. The investigated samples were prepared by solid-state reaction (ceramic) using the corresponding metal oxides and salts in the temperature range 1000,1600 °C in air. Powder X-ray diffraction (PXRD), laser particle size analysis (LPSA), scanning electron microscopy (SEM), and ac impedance spectroscopy measurements were employed for structural, morphology, and electrical characterization. PXRD studies reveal the formation of single-phase cubic fluorite-type structures for all investigated samples except those doped with In3+. The variation of lattice parameters is consistent with ionic radii (IR) of the dopant metal ions, with the exception of Na+ -doped CeO2. Our attempt to substitute In3+ for Ce4+ in CeO2 using both ceramic and wet chemical methods was unsuccessful. Furthermore, diffraction peaks attributed to CeO2 and In2O3 were observed up to sintering conditions of 1600 °C. Among the single-phase compounds investigated, Ce0.85Ca0.05Sm0.1O1.9 exhibits the highest bulk conductivity of 1.3 × 10,3 S/cm at 500 °C with activation energy of 0.64 eV in air. The electrical conductivity data obtained for Ce0.85Ca0.05Sm0.1O1.9 in air and Ar were found to be very similar over the investigated temperature range, indicating the absence of p-electronic conduction in the high oxygen partial pressure (pO2) range which is consistent with literature reported on Sm-doped CeO2. Copyright © 2008 Curtin University of Technology and John Wiley & Sons, Ltd. [source] Time-resolved scattering investigations of brome mosaic virus microcrystals appearanceACTA CRYSTALLOGRAPHICA SECTION D, Issue 10-1 2002M. Casselyn The behavior of brome mosaic virus in solution as a function of physico-chemical conditions has already been characterized by Small Angle X-ray Scattering studies. The most striking result was that the precipitates induced by the addition of polyethylene glycol were in fact made of microcrystals. This result was reinvestigated on the ID2 beamline at ESRF (Grenoble, France) to determine whether there was an amorphous state before the organized one, and measure the necessary period of latency for the microcrystals to form. The stopped-flow device associated to the high brilliance of the beamline enabled us to characterize the growth of the diffraction peaks as a function of time. [source] | ||||||||||||||||