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Diffraction Imaging (diffraction + imaging)
Selected AbstractsPrinciples of Highly Resolved Determination of Texture and Microstructure using High-Energy Synchrotron Radiation,ADVANCED ENGINEERING MATERIALS, Issue 6 2009Helmut Klein Abstract Diffraction imaging with hard X-rays (high-energy synchrotron radiation) using the detector sweeping techniques allows measurement of the texture and microstructure of polycrystalline materials with high orientation- and location-resolution. These techniques provide continuous two-dimensional images of different sections and projections of the six-dimensional "orientation-location" space. For the high orientation resolution case, it is possible to measure the orientation and location coordinates of up to 105 individual grains simultaneously. From these parameters, the grain size and shape can also be obtained, yielding the complete orientation stereology of the polycrystalline aggregate, which is required for its complete characterization. For the high location resolution case, the intensity at any point of the diagrams corresponds to a pole density as a function of the orientation-location space. [source] Diffraction imaging in depthGEOPHYSICAL PROSPECTING, Issue 5 2008T.J. Moser ABSTRACT High resolution imaging is of great value to an interpreter, for instance to enable identification of small scale faults, and to locate formation pinch-out positions. Standard approaches to obtain high-resolution information, such as coherency analysis and structure-oriented filters, derive attributes from stacked, migrated images. Since they are image-driven, these techniques are sensitive to artifacts due to an inadequate migration velocity; in fact the attribute derivation is not based on the physics of wave propagation. Diffracted waves on the other hand have been recognized as physically reliable carriers of high- or even super-resolution structural information. However, high-resolution information, encoded in diffractions, is generally lost during the conventional processing sequence, indeed migration kernels in current migration algorithms are biased against diffractions. We propose here methods for a diffraction-based, data-oriented approach to image resolution. We also demonstrate the different behaviour of diffractions compared to specular reflections and how this can be leveraged to assess characteristics of subsurface features. In this way a rough surface such as a fault plane or unconformity may be distinguishable on a diffraction image and not on a traditional reflection image. We outline some characteristic properties of diffractions and diffraction imaging, and present two novel approaches to diffraction imaging in the depth domain. The first technique is based on reflection focusing in the depth domain and subsequent filtering of reflections from prestack data. The second technique modifies the migration kernel and consists of a reverse application of stationary-phase migration to suppress contributions from specular reflections to the diffraction image. Both techniques are proposed as a complement to conventional full-wave pre-stack depth migration, and both assume the existence of an accurate migration velocity. [source] Diffraction imaging of spheres and melanoma cells with a microscope objectiveJOURNAL OF BIOPHOTONICS, Issue 8-9 2009Kenneth M. Jacobs Abstract Diffraction imaging of polystyrene spheres and B16F10 mouse melanoma cells embedded in gel has been investigated with a microscope objective. The diffraction images acquired with the objective from a sphere have been shown to be comparable to the Mie theory based projection images of the scattered light if the objective is translated to defocused positions towards the sphere. Using a confocal imaging based method to reconstruct and analyze the 3D structure, we demonstrated that genetic modifications in these cells can induce morphological changes and the modified cells can be used as an experimental model for study of the correlation between 3D morphology features and diffraction image data. (© 2009 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim) [source] Diffraction imaging in depthGEOPHYSICAL PROSPECTING, Issue 5 2008T.J. Moser ABSTRACT High resolution imaging is of great value to an interpreter, for instance to enable identification of small scale faults, and to locate formation pinch-out positions. Standard approaches to obtain high-resolution information, such as coherency analysis and structure-oriented filters, derive attributes from stacked, migrated images. Since they are image-driven, these techniques are sensitive to artifacts due to an inadequate migration velocity; in fact the attribute derivation is not based on the physics of wave propagation. Diffracted waves on the other hand have been recognized as physically reliable carriers of high- or even super-resolution structural information. However, high-resolution information, encoded in diffractions, is generally lost during the conventional processing sequence, indeed migration kernels in current migration algorithms are biased against diffractions. We propose here methods for a diffraction-based, data-oriented approach to image resolution. We also demonstrate the different behaviour of diffractions compared to specular reflections and how this can be leveraged to assess characteristics of subsurface features. In this way a rough surface such as a fault plane or unconformity may be distinguishable on a diffraction image and not on a traditional reflection image. We outline some characteristic properties of diffractions and diffraction imaging, and present two novel approaches to diffraction imaging in the depth domain. The first technique is based on reflection focusing in the depth domain and subsequent filtering of reflections from prestack data. The second technique modifies the migration kernel and consists of a reverse application of stationary-phase migration to suppress contributions from specular reflections to the diffraction image. Both techniques are proposed as a complement to conventional full-wave pre-stack depth migration, and both assume the existence of an accurate migration velocity. [source] Coherent X-ray scattering and lensless imaging at the European XFEL FacilityJOURNAL OF SYNCHROTRON RADIATION, Issue 6 2007I. A. Vartanyants Coherent X-ray diffraction imaging is a rapidly advancing form of lensless microscopy. The phase information of the diffraction pattern is embedded in a sufficiently sampled coherent diffraction pattern. Using advanced computational methods, this diffraction pattern can be inverted to produce an image of a sample with diffraction-limited resolution. It is attractive to use high-power coherent X-ray beams produced by future X-ray free-electron lasers for imaging nanoscale condensed matter, materials and biological samples. Here, the scientific case, requirements and the possible realisation of the coherent X-ray diffraction imaging beamlines at the European XFEL Facility are presented. [source] Present state and perspectives of synchrotron radiation diffraction imagingJOURNAL OF SYNCHROTRON RADIATION, Issue 3 2002J. Baruchel The modern third-generation synchrotron radiation sources offer enhanced possibilities for all variants of imaging techniques. The quantitative and qualitative improvements with respect to previous synchrotron diffraction imaging work, which include the investigation in transmission of bulky samples, the use, as an additional parameter, of the sample-to-detector distance, and the use of the coherence of the beam, are illustrated by several examples. Emphasis is given to the possibilities associated with modern electronic detectors for this type of imaging. The new techniques implemented at the ESRF that take full advantage of new capabilities, and more particularly that of `topo-tomography', are presented. [source] Astigmatic electron diffraction imaging: a novel mode for structure determinationACTA CRYSTALLOGRAPHICA SECTION A, Issue 3 2005W. McBride In a conventional transmission electron microscope, stigmators are used to correct for the effects of axial astigmatism in the diffraction lens. It seems feasible that these same stigmators could also be used to form a series of `astigmatic' diffraction patterns. It is shown how this series of diffraction patterns could then be used to perform exit-surface wavefunction reconstruction. This has the advantage that the diffraction patterns are not resolution limited by the objective aperture as are images when performing exit-surface wavefunction reconstruction from a focal series. A scheme for carrying out phase reconstruction from a series of astigmatic diffraction patterns in an electron microscope is presented. [source] Diffraction and imaging study of imperfections of crystallized lysozyme with coherent X-raysACTA CRYSTALLOGRAPHICA SECTION D, Issue 4 2004Z. W. Hu Phase-contrast X-ray diffraction imaging and high-angular-resolution diffraction combined with phase-contrast radiographic imaging were employed to characterize defects and perfection of a uniformly grown tetragonal lysozyme crystal in the symmetric Laue case. The full-width at half-maximum (FWHM) of a 4,4,0 rocking curve measured from the original crystal was ,16.7,arcsec and imperfections including line defects, inclusions and other microdefects were observed in the diffraction images of the crystal. The observed line defects carry distinct dislocation features running approximately along the ,1,1,0, growth front and have been found to originate mostly in a central growth area and occasionally in outer growth regions. Inclusions of impurities or formations of foreign particles in the central growth region are resolved in the images with high sensitivity to defects. Slow dehydration led to the broadening of a fairly symmetric 4,4,0 rocking curve by a factor of ,2.6, which was primarily attributed to the dehydration-induced microscopic effects that are clearly shown in X-ray diffraction images. The details of the observed defects and the significant change in the revealed microstructures with drying provide insight into the nature of imperfections, nucleation and growth, and the properties of protein crystals. [source] | ||||||||||