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Curve Imaging (curve + imaging)

Distribution by Scientific Domains
Physics and Astronomy100%

Selected Abstracts

Analysis of epitaxial laterally overgrown silicon structures by high resolution x-ray rocking curve imaging

CRYSTAL RESEARCH AND TECHNOLOGY, Issue 5 2009
B. Heimbrodt
Abstract Spatially resolved rocking curve imaging has been used to analyze laterally overgrown silicon layers grown by liquid phase epitaxy. We were able to study both the overgrown layer as well as the strain fluctuations of the Si substrate underneath by means of a tabletop x-ray topographic setup. The strain-field analysis reveals relative changes of the lattice parameter up to 3.5×10 -6 in the silicon substrate underneath the overgrown layer in particular regions and a down bending of both wings of the epitaxial overgrown layers. (© 2009 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim) [source]

Correctness of a particular solution of inverse problem in rocking curve imaging

PHYSICA STATUS SOLIDI (A) APPLICATIONS AND MATERIALS SCIENCE, Issue 8 2009
Isabella Huber
Abstract Local lattice misorientations on crystalline substrates can be visualized by rocking curve imaging. Local deviations from Bragg peak positions are extracted from a series of digital topographs recorded by a CCD detector under different azimuths. Bragg peaks from surface regions such as crystallites with a larger local misorientation overlap on the detector, which requires a back-projection method in order to reconstruct the misorientation components on the sample surface from the measured angular position on the detector planes. From mathematical point of view, the reconstruction problem is an inverse problem. In this paper, we formulate the forward and back-projection problems and we prove the correctness of a particular solution. The usability of the method is demonstrated on a phantom data set. [source]