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Counting Statistics (counting + statistics)

Distribution by Scientific Domains

Physics and Astronomy	50%
Chemistry	50%

Selected Abstracts

Counting statistics of X-ray detectors at high counting rates

JOURNAL OF SYNCHROTRON RADIATION, Issue 3 2003
David Laundy
Modern synchrotron radiation sources with insertion devices and focusing optics produce high fluxes of X-rays at the sample, which leads to a requirement for photon-counting detectors to operate at high counting rates. With high counting rates there can be significant non-linearity in the response of the detector to incident X-ray flux, where this non-linearity is caused by the overlap of the electronic pulses that are produced by each X-ray. A model that describes the overlap of detector pulses is developed in this paper. This model predicts that the correction to the counting rate for pulse overlap is the same as a conventional dead-time correction. The model is also used to calculate the statistical uncertainty of a measurement and predicts that the error associated with a measurement can be increased significantly over that predicted by Poisson () statistics. The error differs from that predicted by a conventional dead-time treatment. [source]

A new technique for angle-dispersive powder diffraction using an energy-dispersive setup and synchrotron radiation

JOURNAL OF APPLIED CRYSTALLOGRAPHY, Issue 6 2004
Yanbin Wang
A new diffraction technique for combined angle- and energy-dispersive structural analysis and refinement (CAESAR), by collecting angle-dispersive data using a solid-state detector (SSD) and white synchrotron radiation, is introduced. By step scanning a well calibrated SSD over a limited 2, range, a series of one-dimensional energy-dispersive data (intensity versus energy) are obtained as a function of 2,. The entire intensity (Int) data set consists of several thousand channels covering a range of photon energies, E (up to ,150,keV), at each of the ,1000 2, steps, forming a 2,4 mega-element two-dimensional array, Int(E, 2,). These intensity data are then regrouped according to photon energies, which are defined in the multichannel SSD as individual channels, yielding a large number of intensity versus 2, (angle-dispersive) data sets, Int(E = const., 2,), each of which corresponds to a given photon energy or wavelength. The entire data set, selected subsets or composite scans can be used for multiple data set Rietveld refinement. Data collected both on ,-Al2O3 (a NIST diffraction standard) at ambient conditions and on a mixture of MgO and Au at high pressure were analyzed using the Rietveld technique, with varying schemes of data treatment. Furthermore, it is demonstrated that data within certain energy bands (,E/E = ±10%) may be binned together to improve counting statistics in a composite angle-dispersive scan, even when collected with much coarser scan steps of 0.1 or 0.2°. This technique is useful for high-pressure as well as general purpose powder diffraction studies that have limited X-ray access to the sample using synchrotron radiation. Several advantages are discussed. [source]

Full counting statistics for electron number in quantum dots

PHYSICA STATUS SOLIDI (C) - CURRENT TOPICS IN SOLID STATE PHYSICS, Issue 1 2008
Yasuhiro Utsumi
Abstract Measurements of the average current and its fluctuations (noise) have been powerful tools to study the quantumtransport in mesoscopic systems. Recently it became possible to measure the probability distribution of current, ,full counting statistics' (FCS), by using quantum point-contact charge-detectors. Motivated by recent experiments, we developed the FCS theory for the joint probability distribution of the current and the electron number inside quantum dots (QDs). We show that a non-Gaussian exponential distribution appears when there is no dot state close to the lead chemical potentials. We show that the measurement of the joint probability distribution of current and electron number would reveal nontrivial correlations, which reflect the asymmetry of tunnel barriers. We also show that for increasing strength of tunneling, the quantum fluctuations of charge qualitatively change the probability distribution of the electron number. (© 2007 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim) [source]

Statistics of charge transfer through impurities in strongly correlated 1D metals,

ANNALEN DER PHYSIK, Issue 10-11 2007
A. Komnik
Abstract We review recent advances in the field of full counting statistics (FCS) of charge transfer through impurities imbedded into strongly correlated one-dimensional metallic systems, modelled by Tomonaga-Luttinger liquids (TLLs). We concentrate on the exact analytic solutions for the cumulant generating function, which became available recently and apply these methods in order to obtain the FCS of a non-trivial contact between two crossed TLL. [source]

A toolkit for the characterization of CCD cameras for transmission electron microscopy

ACTA CRYSTALLOGRAPHICA SECTION D, Issue 1 2010
M. Vulovic
Charge-coupled devices (CCD) are nowadays commonly utilized in transmission electron microscopy (TEM) for applications in life sciences. Direct access to digitized images has revolutionized the use of electron microscopy, sparking developments such as automated collection of tomographic data, focal series, random conical tilt pairs and ultralarge single-particle data sets. Nevertheless, for ultrahigh-resolution work photographic plates are often still preferred. In the ideal case, the quality of the recorded image of a vitrified biological sample would solely be determined by the counting statistics of the limited electron dose the sample can withstand before beam-induced alterations dominate. Unfortunately, the image is degraded by the non-ideal point-spread function of the detector, as a result of a scintillator coupled by fibre optics to a CCD, and the addition of several inherent noise components. Different detector manufacturers provide different types of figures of merit when advertising the quality of their detector. It is hard for most laboratories to verify whether all of the anticipated specifications are met. In this report, a set of algorithms is presented to characterize on-axis slow-scan large-area CCD-based TEM detectors. These tools have been added to a publicly available image-processing toolbox for MATLAB. Three in-house CCD cameras were carefully characterized, yielding, among others, statistics for hot and bad pixels, the modulation transfer function, the conversion factor, the effective gain and the detective quantum efficiency. These statistics will aid data-collection strategy programs and provide prior information for quantitative imaging. The relative performance of the characterized detectors is discussed and a comparison is made with similar detectors that are used in the field of X-ray crystallography. [source]