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Conductor Loss (conductor + loss)

Distribution by Scientific Domains
Engineering100%

Selected Abstracts

Accurate closed-form model for computation of conductor loss of coplanar waveguide

INTERNATIONAL JOURNAL OF RF AND MICROWAVE COMPUTER-AIDED ENGINEERING, Issue 1 2010
Payal Majumdar
Abstract This study estimates the accuracy of HFSS and Sonnet and other models against the experimental results from three sources. A closed-form model for experiment based stopping distance is developed to calculate accurately conductor loss of CPW. The present improved Holloway and Kuester (IHK) model has an average accuracy of 3.7% against the experimental results from different sources in the frequency range 1,120 GHz with conductor thickness of 0.25,1.58 ,m. The original Holloway and Kuester model has an average accuracy of 13.7% and model of Ponchak et al. 17.1 % against same set of experimental results. HFSS and Sonnet have average accuracy of 7.86% and 10.33% against same set of experimental data. The accuracy of IHK model is also examined against HFSS and Sonnet for the conductor thickness up to 9 ,m and substrate relative permittivity in the range of 3.8,20. © 2009 Wiley Periodicals, Inc. Int J RF and Microwave CAE, 2010. [source]

Analysis of conductor loss in interdigital capacitor based measurement of dielectric constant of ferroelectric thin film

MICROWAVE AND OPTICAL TECHNOLOGY LETTERS, Issue 3 2008
P. Wang
Abstract A procedure to include conductor loss in interdigital capacitor based dielectric constant measurements is proposed. The effect of conductor loss and contact resistance can be regarded as a series resistor connected to the interdigital capacitor. If the thickness of the conductor film is known, the conductor loss could be calculated and subtracted from the measurement results. In the frequency range where the dielectric constant of the material in test does not change with frequency, the conductor loss could also be obtained by measuring the frequency dependence of the impedance of the interdigital capacitor. © 2008 Wiley Periodicals, Inc. Microwave Opt Technol Lett 50: 566,568, 2008; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.23141 [source]

Modeling of conductor losses in capacitors with rectangular and circular plates

INTERNATIONAL JOURNAL OF RF AND MICROWAVE COMPUTER-AIDED ENGINEERING, Issue 2 2009
A. Deleniv
Abstract Analytic models are developed for the losses in the plates of MIM capacitors. The formulas are derived for the equivalent loss tangent and resistance of the arbitrary thick rectangular electrodes. An equivalent surface resistance is introduced for an arbitrary thick conductor. The accuracy of the model is demonstrated by comparison with rigorous Sonnet simulation and available alternative approach. The formula for the resistance of electrically thick circular electrodes is obtained. The derived expressions are verified via comparison with rigorous HFSS (high frequency structure simulator) simulations using eigenmode solver. © 2008 Wiley Periodicals, Inc. Int J RF and Microwave CAE, 2009. [source]